Pattern independent maximum current estimation in power and ground buses of CMOS VLSI circuits: Algorithms, signal correlations, and their resolution

نویسندگان

  • Harish Kriplani
  • Farid N. Najm
  • Ibrahim N. Hajj
چکیده

Currents owing in the power and ground (P&G) buses of CMOS digital circuits a ect both circuit reliability and performance by causing excessive voltage drops. Excessive voltage drops manifest themselves as glitches on the P&G buses and cause erroneous logic signals and degradation in switching speeds. Maximum current estimates are needed at every contact point in the buses to study the severity of the voltage drop problems and to redesign the supply lines accordingly. These currents, however, depend on the speci c input patterns that are applied to the circuit. Since it is prohibitively expensive to enumerate all possible input patterns, this problem has, for a long time, remained largely unsolved. In this paper, we propose a patternindependent, linear time algorithm (iMax) that estimates at every contact point, an upper bound envelope of all possible current waveforms that result by the application of di erent input patterns to the circuit. The algorithm is extremely e cient and produces good results for most circuits as is demonstrated by experimental results on several benchmark circuits. The accuracy of the algorithm can be further improved by resolving the signal correlations that exist inside a circuit. We also present a novel partial input enumeration (PIE) technique to resolve signal correlations and signi cantly improve the upper bounds for circuits where the bounds produced by iMax are not tight. We establish with extensive experimental results that these algorithms represent a good time-accuracy trade-o and are applicable to VLSI circuits.

برای دانلود رایگان متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Worst Case Voltage Drops in Power and Ground Buses of CMOS VLSI Circuits

Buses of CMOS VLSI Circuits Harish Kriplani, Farid Najm and Ibrahim Hajj Department of Electrical and Computer Engineering, University of Illinois at Urbana-Champaign Abstract: This paper summarizes the main developments of our on going study at University of Illinois on the maximum voltage drop estimation in power and ground buses of CMOS VLSI circuits. Voltage drops occurring in the supply li...

متن کامل

Improved Delay and Current Models for Estimating Maximum Currents in CMOS VLSI Circuits

Excessive voltage drops in power and ground (P&G) buses of CMOS VLSI circuits can severely degrade both design reliability and performance. Maximum current estimates are needed in the circuit to accurately determine the impact of these problems. In [1], a pattern-independent, linear time algorithm (iMax) is described that is very e ective in estimating the maximum current waveforms at various c...

متن کامل

Independent Maximum Current Estimation in Power and Ground Buses of CMOS VLSI Circuits: Algo-

We present a genetic-algorithm-based approach forestimating the maximum power dissipation and instanta-neous current through supply lines for CMOS circuits. Ourapproach can handle large combinational and sequentialcircuits with arbitrary but known delays. To obtain accurateresults we extract the timing and current information fromtransistor-level and general-delay gate-l...

متن کامل

Probabilistic simulation for reliability analysis of CMOS VLSI circuits

A novel current-estimation approach is developed to support the analysis of electromigration failures in power supply and ground busses of CMOS VLSI circuits. It uses the original concept of probabilistic simulation to e ciently generate accurate estimates of the expected current waveform required for electromigration analysis. As such, the approach is pattern-independent and relieves the desig...

متن کامل

Probabilistic Simulation for Reliability Analysis of CMOS VLSI Circuits by

A novel current-estimation approach is developed to support the analysis of electromigration failures in power supply and ground busses of CMOS VLSI circuits. It uses the original concept of probabilistic simulation to e ciently generate accurate estimates of the expected current waveform required for electromigration analysis. As such, the approach is pattern-independent and relieves the desig...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

عنوان ژورنال:
  • IEEE Trans. on CAD of Integrated Circuits and Systems

دوره 14  شماره 

صفحات  -

تاریخ انتشار 1995